Abstract:Iterative learning control (ILC) can significantly improve the tracking performance by learning from previous trials. Recently, kalman-filtering based ILC algorithms (KF-ILC) have been investigated to improve the convergence performance of ILC systems subject to the stochastic noise. However, relevant studies considering the bounded noise have not been reported. Hence, this paper incorporates the set-membership method into the ILC design and analysis for a class of linear systems subject to the bounded noise. Firstly, a new ILC algorithm is designed, i.e., the set-membership based ILC algorithm (SM-ILC), which not only provides an estimate for the desired input but also determines an ellipsoid of confidence for the estimate. Choosing an optimal conclusive parameter by minimizing the size of the confidence ellipsoid under an equality constraint enables SM-ILC monotonic convergence in presence of the bounded noise. The input error under SM-ILC can asymptotically converge to zero if there always exists two worst-case noise vectors of opposite orientations after arbitrary number of trials. Secondly, the convergence performance of KF-ILC when confronted with the bounded noise is revealed with the set-membership method. It is shown that KF-ILC fails to achieve monotonic convergence under the bounded noise. The steady-state input error achievable with KF-ILC is determined by the asymptotic average of the noise. To facilitate the applications of SM-ILC and KF-ILC in practice, the results presented above are generalized to uncertain systems and the frequency-domain counterparts of the lifted algorithms are derived for SISO LTI systems. Finally, a numerical example verifies the theoretical results and an experiment on a linear motor confirms the potential of the proposed ILC algorithms in real-life applications.

Kalman-Filtering-Based Iterative Feedforward Tuning in Presence of Stochastic Noise: with Application to a Wafer Stage

Enhanced kalman-filtering iterative learning control with application to a wafer scanner

Data-Driven Iterative Feedforward Tuning for a Wafer Stage: A High-Order Approach Based on Instrumental Variables

Convergence Rate Oriented Iterative Feedback Tuning with Application to an Ultraprecision Wafer Stage

Optimal feedforward control with a parametric structure applied to a wafer stage.

Feedforward Tuning by Fitting Iterative Learning Control Signal for Precision Motion Systems

Design of an Active Vibration Isolation Control Strategy Based on IFT Method

Rational Feedforward Tuning Using Variance-Optimal Instrumental Variables Method Based on Dual-Loop Iterative Learning Control.

An Adaptive Data-Driven Iterative Feedforward Tuning Approach Based on Fast Recursive Algorithm: With Application to a Linear Motor

Data-Driven Feedforward Learning With Force Ripple Compensation for Wafer Stages: A Variable-Gain Robust Approach

Beyond Performance of Learning Control Subject to Uncertainties and Noise: A Frequency-Domain Approach Applied to Wafer Stages

Dual-Loop Iterative Learning Control with Application to an Ultraprecision Wafer Stage

Method to improve convergence performance of iterative learning control systems with bounded noise

A time-varying Q-filter design for iterative learning control with application to an ultra-precision dual-stage actuated wafer stage.

An Adaptive Kalman Filter for Physiological Tremor Suppression in Robot-Assisted Minimally Invasive Surgery

Data-driven rational feedforward tuning: With application to an ultraprecision wafer stage

A Variational Bayesian Based Strong Tracking Interpolatory Cubature Kalman Filter for Maneuvering Target Tracking

Optimal iterative feedforward parameter tuning for varying trajectory under actuator constraints

Real-Time Frequency-Tracking Method Based on Interpolated Kalman Filter Using Vibration and Surface Noise

Frequency-Domain Data-Driven Adaptive Iterative Learning Control Approach: With Application to Wafer Stage

Model-Based ILC with a Modified Q-Filter for Complex Motion Systems: Practical Considerations and Experimental Verification on a Wafer Stage