An Exhaustive Research on the Application of Intrusion Detection Technology in Computer Network Security in Sensor Networks
Yajing Wang,Juan Ma,Ashutosh Sharma,Pradeep Kumar Singh,Gurjot Singh Gaba,Mehedi Masud,Mohammed Baz
DOI: https://doi.org/10.1155/2021/5558860
IF: 2.336
2021-05-28
Journal of Sensors
Abstract:Intrusion detection is crucial in computer network security issues; therefore, this work is aimed at maximizing network security protection and its improvement by proposing various preventive techniques. Outlier detection and semisupervised clustering algorithms based on shared nearest neighbors are proposed in this work to address intrusion detection by converting it into a problem of mining outliers using the network behavior dataset. The algorithm uses shared nearest neighbors as similarity, judges whether it is an outlier according to the number of nearest neighbors of a data point, and performs semisupervised clustering on the dataset where outliers are deleted. In the process of semisupervised clustering, vast prior knowledge is added, and the dataset is clustered according to the principle of graph segmentation. The novelty of the proposed algorithm lies in outlier detection while effectively avoiding the dependence on parameters, thus eliminating the influence of outliers on clustering. This article uses real datasets: lypmphography and glass for simulation purposes. The simulation results show that the algorithm proposed in this paper can effectively detect outliers and has a good clustering effect. Furthermore, the experimentation reveals that the outlier detection-based SCA-SNN algorithm has the best practical effect on the dataset without outliers, clearly validating the clustering performance of the outlier detection-based SCA-SNN algorithm. Furthermore, compared to the other state-of-the-art anomaly detection method, it was revealed that the anomaly detection technology based on outlier mining does not require a training process. Thus, they overcome the current anomaly detection problems caused due to incomplete normal patterns in training samples.
engineering, electrical & electronic,instruments & instrumentation