Photodetectors: Broadband High‐Responsivity Photodetectors Based on Large‐Scale Topological Crystalline Insulator SnTe Ultrathin Film Grown by Molecular Beam Epitaxy (advanced Optical Materials 5/2017)

Tian Jiang,Yunyi Zang,Honghui Sun,Xin Zheng,Yu Liu,Yan Gong,Liang Fang,Xiang'ai Cheng,Ke He
DOI: https://doi.org/10.1002/adom.201770031
IF: 9
2017-01-01
Advanced Optical Materials
Abstract:Broadband high responsivity photodetectors based on large scale topological crystalline insulator SnTe ultrathin film grown by molecular beam epitaxy are fabricated by Tian Jiang, Xiang'ai Cheng, and co-workers in article number 1600727. The photoconductive detectors exhibit fast and stable photoresponses from the visible to mid-infrared range (405 nm−3.8 μm) and high responsibility (3.75 AW−1 at 2003 nm at room temperature), which will promote applications in broadband and sensitive optoelectronic devices.
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