Nanoscale Imaging of Li and B in Nuclear Waste Glass, A Comparison of Tof-Sims, Nanosims, and Apt

Zhaoying Wang,Jia Liu,Yufan Zhou,James J. Neeway,Daniel K. Schreiber,Jarrod V. Crum,Joseph V. Ryan,Xue-Lin Wang,Fuyi Wang,Zihua Zhu
DOI: https://doi.org/10.1002/sia.6049
2016-01-01
Surface and Interface Analysis
Abstract:It has been very difficult to use popular elemental imaging techniques to image Li and B distribution in glass samples with nanoscale resolution. In this study, time-of-flight secondary ion mass spectrometry, nanoscale secondary ion mass spectrometry, and atom probe tomography (APT) were used to image the distribution of Li and B in two representative glass samples, and their performance was comprehensively compared. APT can provide three-dimensional Li and B imaging with very high spatial resolution (2nm). In addition, absolute quantification of Li and B is possible, although there remains room for improving accuracy. However, the major drawbacks of APT include poor sample compatibility and limited field of view (normally 100x100x500nm(3)). Comparatively, time-of-flight secondary ion mass spectrometry and nanoscale secondary ion mass spectrometry are sample-friendly with flexible field of view (up to 500x500 mu m(2) and image stitching is feasible); however, lateral resolution is limited to only about 100nm. Therefore, secondary ion mass spectrometry and APT can be regarded as complementary techniques for nanoscale imaging of Li and B in glass and other novel materials. Copyright (c) 2016 John Wiley & Sons, Ltd.
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