Total-Ionizing-Dose Effects on a Graphene X-Ray Detector Laser-Scribed from Graphene Oxide
Ning-Qin Deng,Wen-Jun Liao,Jing Hu,Peng Wang,Meng-Xuan Xu,Hai-Nan Zhang,Pan Wang,Chun-Dong Liang,He Tian,Liang Chen,Xiao-Ping Ouyang,Yi Yang,Tian-Ling Ren,En Xia Zhang,Daniel M. Fleetwood
DOI: https://doi.org/10.1109/tns.2017.2776201
IF: 1.703
2017-01-01
IEEE Transactions on Nuclear Science
Abstract:We have evaluated the total-ionizing-dose response of graphene-based X-ray detectors fabricated from graphene oxide (GO) via laser scribing. Raman characterization shows that the resulting structures exhibit the desired conversion of GO to graphene; both high-and low-resistance detectors are formed. The detectors are quite radiation sensitive, as demonstrated by fast pulse testing. The response time of the detectors degrades with total-ionizing dose exposure as a result of electron trapping at residual oxygen from unreacted GO and/or adsorbed oxygen on the graphene surface.