The Working Memory Updating of High and Low Test-Anxious Students:the Effect of the Task Load and Stimuli

GUO Wei,ZOU Jilin,GAO Xin,ZHOU Renlai
DOI: https://doi.org/10.3969/j.issn.1007-3728.2012.07.012
2012-01-01
Abstract:The present study,by using test-related and neutral pictures as stimuli in the n-back paradigm,aims to explore the working memory updating of high and low test-anxious students under high and low task loads.The results show the following:(1) in the high-and low-load task,the high test-anxious students' time of reaction to test-related pictures is significantly longer than the low test-anxious students';(2) in the high-load task,the high test-anxious students show a significantly lower rate of correct reaction to test-related pictures than the low test-anxious students,but they show no difference in the low-load task;the two groups show no difference in the time of reaction to neutral pictures and the rate of correct reaction.The authors believe that under the high-load task,the high test-anxious students,compared with the low test-anxious students,show significant defects in the working memory updating of test-related pictures.
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