RESONANCE ENHANCED MULTIPHOTON INOIZATION STUDIES OF CF2Cl RADICALS BETWEEN 332nm AND 362Nm

LI QUAN-XIN,SHU JI-NIAN,ZHANG QUN,XU HAI-FENG,YU SHU-QIN,CHEN CONG-XIANG,MA XING-XIAO
DOI: https://doi.org/10.7498/aps.47.1470
1998-01-01
Abstract:The (2+1) resonance-enhanced multiphoton ionization (REMPI) spectra of the CF2Cl radicals, which are generated by a pulsed dc discharge,were investigated between 332 and 362nm.Two new Rydberg states,4s and 4p,were observed and indentified.The observed states and spectroscopic constants include 4s Rydberg state (band origin ν0—0=55371cm-1,ω3′ (CF2 scissors)=523±7cm-1,ω′4 (OPLA,i.e.,out-of-plane bending mode)=734±4cm-1) and 4p Rydberg state (ν0—0=57601.3cm-1,ω3′=552±10cm-1,ω4′=762±12cm-1).The quantum defect values of 4s and 4p Rydberg states were also estimated.It seems that the radical production by a pulsed dc discharge combined with PEMPI technique is a powerful tool to study the electronic state of radicals.
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