Process quality prediction method based on wavelet denoising recursive partial least square

Yao Yi-yong
2008-01-01
Computer Integrated Manufacturing Systems
Abstract:To accurately predict the process quality information interfered by noise,the method of Wavelet Diagnosis Recursive Partial Least Square(WDRPLS) based on wavelet diagnosis and recursive Partial Least Square(PLS) was proposed.Aiming at shortcomings of hard and soft threshold in the wavelet diagnosis,a variable threshold formula based on the two wavelet domains of Wiener filter was proposed by using wavelet multi-scale diagnosis so that it could diagnose by wavelet multi-scale variable threshold method before PLS modeling.To deal with data saturation problem in recurrence PLS,based on the theory of sliding window,rates factor was introduced to control forget degree,and a multi-factor recursive PLS algorithm was constructed.Process quality prediction model was set up by this method,and it could predict process quality information.Finally,an application example was used to validate the effectiveness of method.
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