Improved Critical Point Correspondence for On-line Signature Verification

Bin Li,David Zhang,Kuanquan Wang
2006-01-01
International Journal of Image and Graphics
Abstract:This paper proposes an improved method to detect the critical points and obtain a matching path in 1 dimension (1D) for on-line signature verification. More critical points will be detected and the matching precision will be improved by the proposed method. We first detect critical points by searching 1D signature curves for extremum points. We then introduce an improved DTW algorithm, bidirectional backward-merging DTW (BBMDTW), for the flexible matching of two 1D signature curves. Finally, the critical points and their correspondences will be regressed to 2D signature curves, because the 2D signature curve has more physical appearances of a signer. Keyword: Critical point correspondence, DTW, Backward-merging, 2D regression.
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