K-shell Excitation Dielectronic Recombination Resonance Strengths of Highly Charged He-like to O-like Xe Ions

Tianheng Xu,Gang Xiong,Jun Xiao,Yang,Roger Hutton,Yaming Zou,Ke Yao
DOI: https://doi.org/10.1088/2058-6272/aac573
2018-01-01
Abstract:Dielectronic recombination is an important process in high temperature plasmas. In the present work, the KLn(n?=?L, M, N and O) DR resonance strengths of He-like to O-like xenon ions are measured at the Shanghai electron beam ion trap using a fast electron beam energy scanning method. The experiment uncertainty reaches about 6% with significant improvement of statistics.A relativistic configuration interaction calculation is also made. Theoretical results agree with the experiment results within 15% in most cases.
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