Resistance Growth of Branching Random Networks

Dayue Chen,Yueyun Hu,Shen Lin
DOI: https://doi.org/10.1214/18-ejp179
2018-01-01
Electronic Journal of Probability
Abstract:Consider a rooted infinite Galton–Watson tree with mean offspring number $m>1$, and a collection of i.i.d. positive random variables $\xi _e$ indexed by all the edges in the tree. We assign the resistance $m^d\,\xi _e$ to each edge $e$ at distance $d$ from the root. In this random electric network, we study the asymptotic behavior of the effective resistance and conductance between the root and the vertices at depth $n$. Our results generalize an existing work of Addario-Berry, Broutin and Lugosi on the binary tree to random branching networks.
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