Study of Multilayer Microstructure by XRD Using Noncoplanar Measurement Geometry

Alexander Ulyanenkov,Svetlana Vlasenko,Vladimir Uglov,Gregory Abadias,Andrei Benediktovitch,Jacques O'Connell,Arno Janse van Vuuren
DOI: https://doi.org/10.1107/s2053273317090180
2017-01-01
Abstract:The development of structural materials for nuclear application is of great importance. Along with it, the development of radiation tolerant coatings for the application in reactors is of no less importance [1]. One of the kinds of such protective coatings that often used is nitride-based ceramics due to their specific combination of properties suitable for the nuclear application [2]. Radiation environment induces different kinds of damages in the materials which results in their degradation. One of the radiation induced effects is the appearance of point defects. The presence of boundaries proved to be very effective in reducing the number of such defects. Therefore multilayer systems are considered as coating materials. In the present study we consider multilayer thin coatings ZrN/Si3N4 with different thicknesses of monolayers: unirradiated and irradiated by He+ ions. In order to estimate the effect of radiation on these coatings we investigate the modification of microstructure before and after irradiation.
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