Thermal Stability and High-Temperature Shape Memory Effect of Ni55.2Mn24.7Ga19.9Gd0.2 Thin Film

Jian Yao,Bo Cui,Xiaohang Zheng,Ye Wu,Jiehe Sui,Wei Cai
DOI: https://doi.org/10.1016/j.vacuum.2017.10.022
IF: 4
2018-01-01
Vacuum
Abstract:Thermal stability and shape memory effect (SME) of Ni-Mn-Ga-based thin film were firstly investigated. The fluctuation scope of phase transformation temperatures did not exceed 2 degrees C during 100 thermal cycles. The maximum SME of 0.64% was quantitatively measured under 600 MPa applied stress. SME almost kept constant after 20 times thermal cycling deformation under 300 MPa applied stress. (C) 2017 Elsevier Ltd. All rights reserved.
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