Light-Tunable Nonvolatile Memory Characteristics in Photochromic RRAM

Hai-Feng Ling,Kangming Tan,Qiyun Fang,Xinshui Xu,Hao Chen,Wenwen Li,Yefan Liu,Laiyuan Wang,Mingdong Yi,Ru Huang,Yan Qian,Ling-Hai Xie,Wei Huang
DOI: https://doi.org/10.1002/aelm.201600416
IF: 6.2
2017-01-01
Advanced Electronic Materials
Abstract:Light-tunable resistive switching (RS) characteristics are demonstrated in a photochromophore (BMThCE)-based resistive random access memory. Triggered by nondestructive ultraviolet or visible light irradiation, two memory-type RS characteristics can be reversibly modulated in the same device upon a narrow range of applied voltage (<6 V), accompanied by the photochromophores in the active layer reversibly changed between ring-open state (namely, o-BMThCE) and ring-closed state (namely, c-BMThCE). The o-BMThCE-based memory exhibits a write-once-read-many characteristic with a high current on/off ratio of 10(5), while the c-BMThCE-based one shows a flash characteristic. Both of the RS characteristics present good nonvolatile stability with the resistance states maintained over 10(4) s without variation. This RS modulation is possibly related to the formation and rupture of conductive filaments, which formed along channels consisting of BMThCE trapping molecules. This work provides a new memory element for the design of light-controllable high density storage and data encryption technology.
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