Abstract:Voltage controlled magnetic anisotropy (VCMA) has been considered as an effective method in traditional magnetic devices with lower power consumption. In this article, we have investigated the dual-axis control of magnetic anisotropy in Co 2 MnSi/GaAs/PZT hybrid heterostructures through piezo-voltage-induced strain using the longitudinal magneto-optical Kerr effect (LMOKE) microscopy. The major modification of in-plane magnetic anisotropy of Co 2 MnSi thin film is controlled obviously by the piezo-voltages of lead zirconate titanate (PZT) piezotransducer, accompanying with the coercivity field and magnetocrystalline anisotropy significantly manipulated. Because in-plane cubic and uniaxial magnetic anisotropies are coexisted in Co 2 MnSi thin film, the initial double easy axes of cubic split to an easiest axis (square loop) and an easier axis (two-step loop). While the stress direction is parallel to the [1-10] easiest axis (Sample I), the square loop of [1-10] direction could transform to a two-step loop with the negative piezo-voltages (compressed state). At the same time, the initial two-step loop of the [110] axis simultaneously changes to a square loop (the easiest axis). Otherwise, we designed and fabricated the sample II in which the PZT stress parallel to the [110] two-step axis. The phenomenon of VCMA was also obtained along the [110] and [1-10] directions. However, the manipulated results of Sample II were in contrast to the Sample I under the piezo-voltages. Thus, an effective dual-axis regulation of the in-plane magnetization rotation was demonstrated in this work. Such a finding proposes a more optimized method for the magnetic logic gates and memories based on voltage-controlled magnetic anisotropy in the future.

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