Advanced copy-move forgery detection: utilizing AKAZE in conjunction with SIFT algorithm for image forensics
Poulomi Deb,Nirmalya Kar,Khondekar Lutful Hassan,Bhaskar Biswas
DOI: https://doi.org/10.1007/s00542-024-05773-1
2024-09-26
Microsystem Technologies
Abstract:Abstract Digital picture manipulation is becoming common due to the availability of powerful digital technologies and image editing tools. Despite employing editing techniques to improve photo quality, image forgeries pose a notable challenge. Copy-move forgery (CMF) is a common technique used to manipulate images by copying a specific section of a picture and pasting it elsewhere in the same image, thereby undermining the integrity of the digital image. This work presents a highly effective Copy Move Forgery Detection (CMFD) technique that surpasses the performance and accuracy of existing approaches like SURF (Speeded-Up Robust Features) and SIFT (Scale-invariant feature transform). The proposed methodology integrates the SIFT algorithm with AKAZE (Accelerated-Kaze) to identify key points in greyscale pictures. To accurately identify tampered areas, AKAZE and SIFT extract numerous keypoints, excluding smooth regions, with the Histogram of Oriented Gradients (HOG) utilized as the feature descriptor. This methodology enhances both the efficacy and accuracy of forgery detection and localization within smooth areas. This technique enhances the effectiveness and precision of identifying and pinpointing forged areas in smooth zones. The feature vector is precisely categorized in feature space using the sum of squared differences (SSD) and closest neighbor distance ratio (NNDR) to establish an optimal matching. The RANSAC (Random Sample Consensus) algorithm is subsequently applied to eliminate abnormalities found in previous phases. Experimental findings have confirmed the algorithm's superiority over contemporary methodologies based on various metrics, including Precision, Recall, and F- score. Furthermore, the algorithm demonstrates resilience against geometric attacks, such as scaling, rotation, and noise.
engineering, electrical & electronic,materials science, multidisciplinary,nanoscience & nanotechnology,physics, applied