Design On-Chip Width-Modulated Line-Defect Cavity Array Structure for Multiplexing Complex Refractive Index Sensing

Fujun Sun,Jian Zhou,Lijun Huang,Zhongyuan Fu,Zhaoxiang Ding,Huiping Tian
DOI: https://doi.org/10.1016/j.sna.2017.01.024
2017-01-01
Abstract:We propose an integrated sensor array based on photonic crystal width-modulated line-defect micro cavity for complex refractive index sensing. The width-modulated line-defect cavity is formed by decreasing the width of W1 waveguide with several holes in the first row shifted towards the line defect. By applying the three-dimensional finite-difference time-domain (3D-FDTD) simulation method, we demonstrate that simply shifting eight holes on each side by a distance of 100 nm is sufficient to achieve a high quality (Q) factor over 2 x 10(4). The proposed device consists of two cascaded micro-cavities with Q-factor over 1.5 x 10(4). The sensitivities of the real part (n) for cavity-1 and cavity-2 are 174.1 nm/RIU (refractive index unit) and 167.6 nm/RIU, respectively. The sensitivities of the imaginary part (k) are 230 nm/RIU and 200 nm/RIU for cavity-1 and cavity-2, respectively. In addition, a phenomenon that the sensitivity of imaginary part is much higher for smaller k values is described and explained. To the best of our knowledge, this is the first geometry to realize high-sensitivity multiplexing complex refractive index sensing. (C) 2017 Elsevier B.V. All rights reserved.
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