High dimensional cross-sectional dependence test under arbitrary serial correlation

Wei Lan,Rui Pan,RongHua Luo,YongWei Cheng
DOI: https://doi.org/10.1007/s11425-014-0731-4
2016-01-01
Abstract:In panel data analysis, the cross-sectional dependence (CD) test has been extensively used to test the cross-sectional dependence. However, this traditional CD test does not take serial correlation into consideration, which commonly occurs in many fields. To solve this problem, we propose an adjusted CD test which is able to effectively handle serial correlation. More specifically, the serial correlation can be of arbitrary form in our work. Furthermore, we establish the theoretical properties of the proposed adjusted CD test. Our extensive Monte Carlo experiments show that the traditional CD test cannot work well under serial correlation, while the proposed adjusted CD test does provide rather satisfactory performance.
What problem does this paper attempt to address?