Structure Determination of Synthetic Shlykovite by Using Rotation Electron Diffraction

Zhehao Huang,Jiho Shin,Xiaodong Zou
DOI: https://doi.org/10.1107/s2053273316095991
2016-01-01
Abstract:We have measured the unit cell of Ti from 10 K to 290 K, using a Bruker area detector diffratometer.The three lowest temperatures were 10, 28 and 45 K. Form 90 K to 290 K we used a Cryoindustries of America nitrogen cooler.Below 90 K we used a helium cooler from the same company.The sus for our measurements are about 0.00007 Å for a and 0.00017 Å for c. 290 K values are 2.95151 Å for a and 4.68483 Å for c.Corresponding 10 K values are 2.94650 and 4.67977 Å.From 290 K to 45 K we see no unusual behavior, but at 28 K we measure the c axis to be longer than at 10 and 45 K.The a axis did not show any unusual behavior.This is at variance with earlier published measured and computed values, which showed negative thermal expansion for c below 170 K. Our crystal was of high purity, and the temperatures are reliable to better than 1 K.The measurements we have for comparison were performed with a capacitance dilatometer.
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