A BAYESIAN METHOD FOR THE EVALUATION OF LEVELS OF THE FAILURE RATES OF COMPONENTS

Bei Tao,L Wang,D. Su,Fei H
1990-01-01
Abstract:In order to evaluate the level of the failure rates of the components, a long time and material consuming is required if the sampling plans defined in GB1772-79 (its equivalent in MIL-STD-690)is used. It is almost impossible for these plans to give evaluation for a high level component. The Bayesian method used here, which determines a prior distribution based on large amount of the historical data and plentiful engineering experience, gives a new plan for tests to evaluate level of the failure rate of the components. With the prerequisite of quality assurance of the products, considerable test-time can be saved by using the plan.
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