An investigation on indicators for patent value based on structured data of patent documents

Xiao-jun HU,Jin CHEN
DOI: https://doi.org/10.3969/j.issn.1003-2053.2014.03.004
2014-01-01
Abstract:Technological areas differ in technological complexity,it is well- known that similar amounts of technological knowledge can produce different numbers of patented innovation as output. There is no optimal solution and few relations among indicators for evaluating patent technological value in the field of scientometrics as well as in innovation management. In this study,the relationships between the structural indicators of ego patent citation networks and traditional indicators of technological value of a patent were investigated using sampling data of real patents,and then testified by Monte Carlo Simulation. The results suggest that the structural indicators are significant for providing a multilayered picture of patent technological value.
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