Abstract:This paper offers the trace element data of minerals and glass from experiment reaction products between basaltic melt and Opx at 3.0-4.5GPa and 1300-1450ºC.New mineral–melt distribution coefficients (Ds) of Cpx–basalt and Grt–basalt are offered, which can be used to assess the distribution of trace elements between anhydrous basalt and minerals in the mantle.Experiment results in this paper confirm that reaction between basaltic melt and orthopyroxenite contribute to the generation of high-SiO2 OIBs and account for their chemical variability.Interactions between basaltic melt and orthopyroxenite (Opx) were investigated to gain a better understanding of the consequences of the residence and transport of ocean island basalts (OIBs) within the mantle. The experiments were conducted using a DS-3600 six-anvil apparatus at 3.0–4.5 GPa and 1300–1450 °C. The basaltic melt and Opx coexisted at local equilibrium at these pressures and temperatures; the initial melts dissolved Opx, which modified their chemical composition, and clinopyroxene (Cpx) precipitated with or without garnet (Grt). The trace-element contents of Grt, Cpx, and melt were measured and the mineral–melt distribution coefficients (D) of Cpx–melt and Grt–melt were calculated, which can be used to assess the distribution of trace elements between basalt and minerals in the mantle. Two types of reaction rim were found in the experimental products, Cpx, and Cpx + Grt; this result indicates that residual rocks within the mantle should be pyroxenite or garnet pyroxenite. Both rock types are found in mantle xenoliths from Hawaii, and the rare-earth-element (REE) pattern of Cpx in these mantle pyroxenites matches those of Cpx in the experimental reaction rims. Furthermore, residual melts in the experimental products plot in similar positions to Hawaiian high-SiO2 OIBs on major-element Harker diagrams, and their trace-element patterns show the signature of residual Grt, particularly in runs at ≤1350 °C and 4.0–4.5 GPa. Trace-element concentrations of the experimental residual melts plot in similar positions to the Hawaiian OIBs on commonly used discrimination diagrams (Ti vs. Zr, Cr vs. Y, Cr vs. V, Zr/Y vs. Zr, and Ti/Y vs. Nb/Y). These results indicate that reaction between basaltic melt and pyroxenite might contribute to the generation of Hawaiian high-SiO2 OIBs and account for their chemical variability.<ol class="links-for-figure"><li><a class="anchor download-link u-font-sans" href="https://ars.els-cdn.com/content/image/1-s2.0-S1674987120301511-fx1_lrg.jpg">Download : Download high-res image (285KB)</a></li><li><a class="anchor download-link u-font-sans" href="https://ars.els-cdn.com/content/image/1-s2.0-S1674987120301511-fx1.jpg">Download : Download full-size image</a></li></ol>

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