The Sloan Digital Sky Survey Reverberation Mapping Project: an Investigation of Biases in CIV Emission-Line Properties

K. D. Denney,Keith Horne,Yue Shen,W. N. Brandt,Luis C. Ho,B. M. Peterson,Gordon T. Richards,J. R. Trump,J. Ge

DOI: https://doi.org/10.3847/0067-0049/224/2/14

2016-01-01

The Astrophysical Journal Supplement Series

Abstract:We investigate the dependence on data quality of quasar properties measured from the CIV emission line region at high redshifts. Our measurements come from 32 epochs of Sloan Digital Sky Survey (SDSS) Reverberation Mapping Project spectroscopic observations of 482 z>1.46 quasars. We compare the differences between measurements made from the single-epoch and coadded spectra, focusing on the CIV emission line because of its importance for studies of high-redshift quasar demographics and physical properties, including black hole masses. In addition to statistical errors increasing (by factors of ~2-4), we find increasing systematic offsets with decreasing S/N. The systematic difference (measurement uncertainty) in our lowest S/N (<5) subsample between the single-epoch and coadded spectrum (i) CIV equivalent width is 17A (31A), (ii) centroid wavelength is <1A (2A), and fractional velocity widths, Delta V/V, characterized by (iii) the line dispersion, sigma_l, is 0.104 (0.12), and (iv) the mean absolute deviation (MAD) is 0.072 (0.11). These remain smaller than the 1-sigma measurement uncertainties for all subsamples considered. The MAD is found to be the most robust line-width characterization. Offsets in the CIV full-width at half maximum (FWHM) velocity width and the CIV profile characterized by FWHM/sigma_l are only smaller than the statistical uncertainties when S/N>10, although offsets in lower S/N spectra exceed the statistical uncertainties by only a factor of ~1.5. Characterizing the CIV line profile by the kurtosis is the least robust property investigated, as the median systematic coadded--single-epoch measurement differences are larger than the statistical uncertainties for all S/N subsamples.