Abstract:Dynamic random access memory (DRAM) is being upgraded iteratively, and as a result, its transmission rate and bandwidth are rising quickly. Simultaneously, as the DRAM process has advanced, the storage cell size has decreased and cell integration has improved within each device, leading to a significant boost in storage capacity and density. DRAM has been widely utilized as a crucial storage component in personal computers, mobile devices, servers, and data centers because of these benefits. However, data reliability is greatly hampered by DRAM’s vulnerability to single-bit, row, and column errors, which result in data loss and corruption as well as the possibility of system crashes and downtime. Error correction codes (ECC) are used by DRAM to protect data and increase reliability, but because large capacity DRAM is more prone to multi-bit errors of cross-chip. Traditional error correction strategies are unable to keep up with the demand for multi-bit errors of cross-chip. Therefore, a crucial problem that needs to be solved is the design of an ECC strategy with robust error correction capabilities. A high order ECC scheme with stronger error correcting capability is developed at a higher firmware layer without changing the hardware architecture to address reliability issues brought by DRAM multi-bit errors of cross-chip. The higher order ECC technique is then used to gain a stronger error correction capability while minimizing the latency overhead when an uncorrectable error is discovered by rank-level ECC (RECC). The error correction performance of the proposed high order ECC algorithm is evaluated and verified using simulation experiments in terms of both error correction capability and encoding/decoding latency. Simulation results show that compared with existing ECC schemes, the proposed high order ECC scheme for DRAM reduces latency by 69% and storage overhead by 5.56%. The proposed high order ECC method has significant research implications and is useful in preventing data loss and enhancing DRAM reliability.

Proactive Correction Coset Decoding Scheme Based on SEC-DED Code for Multibit Asymmetric Errors in STT-MRAM

Extended Coset Decoding Scheme for Multi-Bit Asymmetric Errors in Non-Volatile Memories.

Bit-error-rate aware sensing-error correction interaction in spintronic MRAM

LDPC Joint Decoding Scheme for STT MRAM Storage

Improving Reliability of Non-Volatile Memory Technologies Through Circuit Level Techniques and Error Control Coding

Efficient Low-Density Parity-Check (LDPC) Code Decoding for Combating Asymmetric Errors in STT-RAM

One-Step Majority-Logic-Decodable Codes Enable Stt-Mram for High Speed Working Memories

Deep-Learning-Based Adaptive Error-Correction Decoding for Spin-Torque Transfer Magnetic Random Access Memory (STT-MRAM)

Design of Rate-Compatible Protograph LDPC Codes for Spin-Torque Transfer Magnetic Random Access Memory (STT-MRAM)

Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM

Deep Learning-Based Decoding of Linear Block Codes for Spin-Torque Transfer Magnetic Random Access Memory (STT-MRAM)

Efficient LDPC Code Design for Combating Asymmetric Errors in STT-RAM.

Enhancing the Reliability of STT-RAM Through Circuit and System Level Techniques

Theory Study and Implementation of Configurable ECC on RRAM Memory.

Enhanced Positional SECDED: Achieving Maximal Double-Error Correction in Racetrack Memories

Improving DRAM Reliability Using a High Order Error Correction Code

Enhanced Error Correction Against Multiple-Bit-Upset Based on Bch Code for Sram

Balancing the Lifetime and Storage Overhead on Error Correction for Phase Change Memory

A High-reliability Reading Scheme for STT-MRAM with a Symmetric Dual-reference Sensing Amplifier

TSE: Two-Step Elimination for MLC STT-RAM Last-Level Cache

Dynamic Dual-Reference Sensing Scheme for Deep Submicrometer STT-MRAM