Abstract:A preliminary design of a mega-electron-volt (MeV) monochromator with 10 −5 energy spread for ultrafast electron diffraction (UED) and ultrafast electron microscopy (UEM) is presented. Such a narrow energy spread is advantageous in both the single shot mode, where the momentum resolution in diffraction is improved, and the accumulation mode, where shot-to-shot energy jitter is reduced. In the single-shot mode, we numerically optimized the monochromator efficiency up to 13% achieving 1.3 million electrons per pulse. In the accumulation mode, to mitigate the efficiency degradation caused by the shot-to-shot energy jitter, an optimized gun phase yields only a mild reduction of the single-shot efficiency, therefore the number of accumulated electrons nearly proportional to the repetition rate. Inspired by the recent work of Qi et al. (Phys Rev Lett 124:134803, 2020), a novel concept of applying reverse bending magnets to adjust the energy-dependent path length difference has been successfully realized in designing a MeV monochromator to achieve the minimum energy-dependent path length difference between cathode and sample. Thanks to the achromat design, the pulse length of the electron bunches and the energy-dependent timing jitter can be greatly reduced to the 10 fs level. The introduction of such a monochromator provides a major step forward, towards constructing a UEM with sub-nm resolution and a UED with ten-femtosecond temporal resolution. The one-to-one mapping between the electron beam parameter and the diffraction peak broadening enables a real-time nondestructive diagnosis of the beam energy spread and divergence. The tunable electric–magnetic monochromator allows the scanning of the electron beam energy with a 10 −5 precision, enabling online energy matching for the UEM, on-momentum flux maximizing for the UED and real-time energy measuring for energy-loss spectroscopy. A combination of the monochromator and a downstream chicane enables “two-color” double pulses with femtosecond duration and the tunable delay in the range of 10 to 160 fs, which can potentially provide an unprecedented femtosecond time resolution for time resolved UED.

Optimization of Monochromated TEM for Ultimate Resolution Imaging and Ultrahigh Resolution Electron Energy Loss Spectroscopy.

Optimization for Imaging Through Scattering Media for Confocal Microscopes with Divided Elliptical Apertures.

Toward Monochromated Sub-Nanometer UEM and Femtosecond UED

Lossless Monochromator in an Ultrafast Electron Microscope Using Near-Field THz Radiation

Development and Applications of Monochromator in Transmission Electron Microscope

Ultrahigh Resolution of Electron Energy Loss Spectroscopy by a Monochromated Titan TEM: Towards Challenging Nanomaterials Characterization

Application of High-Resolution Electron Energy-Loss Spectroscopy in Materials Science

Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Design and Optimization of a Spectrometer for High-Resolution SD-OCT

Using Electron Energy-Loss Spectroscopy to Measure Nanoscale Electronic and Vibrational Dynamics in a TEM

Optimizing Experimental Parameters for Orbital Mapping

Development of Analytical Ultrafast Transmission Electron Microscopy Based on Laser-Driven Schottky Field Emission

Sub-0.5 eV EFTEM Mapping using the Zeiss SESAM

Computational ghost imaging for transmission electron microscopy

Simulation Optimization of Single-Shot Continuously Time-Resolved MeV Ultra-Fast Electron Diffraction

Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources

Note: Optical Optimization for Ultrasensitive Photon Mapping with Submolecular Resolution by Scanning Tunneling Microscope Induced Luminescence.

Retrofittable Laser-free Khz to GHz Tunable Pulser for Ultra-fast Electron Microscopy

Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment

μeV electron spectromicroscopy using free-space light

An $\textit{In Situ}$ Light Illumination System for an Aberration-Corrected Environmental Transmission Electron Microscope