Verification and Improvement of Equivalent Refractive Index Models for Evaluating the Shielding Effectiveness of High-Transmittance Double-Layer Metallic Meshes.

Zhengang Lu,Yeshu Liu,Heyan Wang,Jiubin Tan
DOI: https://doi.org/10.1364/ao.55.005372
IF: 1.9
2016-01-01
Applied Optics
Abstract:The validity of real and complex equivalent refractive index models (ERIMs) is verified for a shielding effectiveness evaluation of high-transmittance double-layer metallic meshes. Theoretical and experimental studies show that the real ERIM is invalid for thin substrates and inaccurate for thick substrates for double-layer meshes, although it has long been used successfully for single-layer meshes. However, the complex ERIM shows more reasonable results not only for double-layer but also for single-layer meshes, and the evaluation accuracy is further improved by modifying the equivalent reactance coefficient using least-squares fitting. Therefore, the modified complex ERIM is applicable in most conditions.
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