Multiresolution Analysis Based on Dual-Scale Regression for Pansharpening
Peng Wang,Hongyu Yao,Cai Li,Gong Zhang,Henry Leung
DOI: https://doi.org/10.1109/tgrs.2021.3131477
IF: 8.2
2022-01-01
IEEE Transactions on Geoscience and Remote Sensing
Abstract:Pansharpening technique is used to merge the original multispectral image (MS) with a high spatial resolution panchromatic image (PAN). Due to its robustness, the multiresolution analysis (MRA) is an important part of pansharpening. The scale regression model is effective for improving MRA. However, the existing MRA based on scale regression results into single-scale regression information, thus affecting the final pansharpening result. To address this problem, in this work, we propose a dual-scale regression-based MRA for pansharpening. First, we establish a scale regression-based model. Then, this model is improved using a high-pass modulation (HPM) injection scheme. Finally, the dual-scale information is added to the scale regression to construct the dual-scale regression for obtaining the final pansharpening result. We perform experiments using five datasets. The results show that the proposed method obtains a better pansharpening result as compared to various state-of-the-art MRA methods. In addition, the quantitative and qualitative analysis of the results shows that the proposed method achieves appropriate spatial and spectral resolution fusion. Therefore, it has a great potential in pansharpening technique.
imaging science & photographic technology,remote sensing,engineering, electrical & electronic,geochemistry & geophysics