Deep Localized Metric Learning.

Yueqi Duan,Jiwen Lu,Jianjiang Feng,Jie Zhou
DOI: https://doi.org/10.1109/TCSVT.2017.2711015
IF: 5.859
2018-01-01
IEEE Transactions on Circuits and Systems for Video Technology
Abstract:Metric learning has been widely used in many visual analysis applications, which learns new distance metrics to measure the similarities of samples effectively. Conventional metric learning methods learn a single linear Mahalanobis metric, yet such linear projections are not powerful enough to capture the nonlinear relationships. Recently, deep metric learning approaches, such as discriminative de...
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