Abstract:Due to the increasing challenges posed by the relentless rise in the design complexity of integrated circuits, Boolean Satisfiability (SAT) has emerged as a robust alternative to structural APTG techniques. However, the high cost of transforming a circuit testing problem to a Conjunctive Normal Form (CNF) limits the application of SAT in industrial ATPG scenarios, resulting in a loss of test coverage. In Order to address this problem, this paper proposes a conflict-driven structural learning (CDSL) ATPG algorithm firstly, in which the conflict-driven heuristic methods in modern SAT solver are implemented on the logic cone of fault propagation and activation directly. The proposed CDSL algorithm is composed of three parts: (1) According to the implication graph, various conflict constraints have been learned to prune search space. (2) Conflict-driven implication and justification have been applied to increase decision accuracy and solving efficiency. (3) A conflict-based diagnosis method is further proposed in the case of low coverage debug, leading to making the aborted faults testable by relaxing or modifying some constraints on primary inputs. Extensive experimental results on industrial circuits demonstrate the effectiveness and efficiency of the proposed CDSL algorithm. It is shown that compared with the SAT-based ATPG, the proposed CDSL can on average decrease $25.6\%$ aborted faults with $94.51\%$ less run time. With a two-stage computational flow, it has shown that the proposed CDSL can lead to $46.37\%$ less aborted faults than a one-stage structural algorithm, further with the $3.19\%$ improvement on fault coverage. In addition, the conflict diagnosis can lead to $8.89\%$ less aborted faults on average, and $0.271\%$ improvement in fault coverage rate.

An Efficient Approach for Computing Conflict Sets Combining Failure Probability with SAT.

SALSA-Based Method for Identifying Critical Component and Critical Component Outage Causality with Cascading Failure Data

Conflict-driven Structural Learning Towards Higher Coverage Rate in ATPG

Satisfiability-based Method for Reconfiguring Power Efficient VLSI Array

A Conflict-Free Approach for Parallelizing SAT-based De-Camouflaging Attacks

SAT-controlled Redundancy Addition and Removal: a Novel Circuit Restructuring Technique

A Novel Iterative Contingency Filtering Approach to Corrective Security-Constrained Optimal Power Flow

Parallelizing SAT-based De-Camouflaging Attacks by Circuit Partitioning and Conflict Avoiding

A Novel Simulation Approach to Extended Dynamic Fault Trees Analysis for Highly-reliable Satellite OBDH Subsystem

EDA-Driven Preprocessing for SAT Solving

Improved Differential Fault Analysis Of Sosemanuk With Algebraic Techniques

A new approach to test generation for combinational circuits

Enhance SAT Conflict Analysis for Model Checking

Compact estimation of distribution algorithm for semiconductor final testing scheduling problem

ICONE23-1293 APPLICATION OF SUBSET SIMULATION METHODS TO DYNAMIC FAULT TREE ANALYSIS

A Semi-Tensor Product based Circuit Simulation for SAT-sweeping

PFGASAT - a Genetic SAT Solver Combining Partitioning and Fuzzy Strategies

Model Reduction Method Based on Selective Clustering Ensemble Algorithm and Theory of Constraints in Semiconductor Wafer Fabrication.

SKI-SAT: A CMOS-compatible Hardware for Solving SAT Problems

RTSAT: A Hybrid Satisfiability Solver for RTL Circuits

Hybrid Sat Solver Considering Circuit Observability