Voltage flicker measurement method using improved Teager-Kaiser energy operator based on Nuttall window spectral correction

gao yunpeng,li feng,chen jing,teng zhaosheng,cao yijia
DOI: https://doi.org/10.19650/j.cnki.cjsi.2014.04.004
2014-01-01
Abstract:Voltage flicker is the important pollution source in power systems currently,and how to extract voltage flicker envelope parameters in real time and accurately obtain voltage flicker value in a complex environment is the difficult problem in the field of power quality analysis. In order to reduce the real-time extraction errors of complex voltage flicker envelope,the error correction factor of improved Teager-Kaiser energy operator is established in this paper. Nuttall window is adopted to perform weighted correction on the results extracted with improved Teager-Kaiser energy operator,then the corrected results are analyzed and corrected with improved FFT method,and the applicable correction formulas for the amplitudes and frequencies extracted from the voltage flicker envelope are deduced. The voltage flicker measurement process recommended in the IEC standard is simplified. The algorithms for voltage flicker envelope real time extraction and voltage flicker value calculation using improved Teager-Kaiser energy operator based on Nuttall window spectral correction are proposed and established,based on which a voltage flicker online detector was developed based on ADS8556 + TMS320C6745 architecture. The simulation analysis and experiment result show that this approach can effectively overcome the influences of single modulation wave frequency change,multi-frequency modulation wave,grid fundamental frequency fluctuation,harmonics & inter-harmonics and white noise on voltage flicker measurement results. Compared with conventional voltage flicker measurement methods,this approach features simple implementation,less calculation in voltage flicker extraction,can obtain precise and stable measurement results,and can be used for the real-time analysis and online monitoring of voltage flicker parameters.
What problem does this paper attempt to address?