Importance sampling measured BRDFs based on second order spherical moment

Jie Guo,Yanwen Guo,Jingui Pan
DOI: https://doi.org/10.1145/3145690.3145698
2017-01-01
Abstract:BRDF importance sampling, which generates sampled directions in a pattern that closely matches the BRDF, is a powerful tool for variance reduction in Monte Carlo rendering. Conventionally, it is challenging to design proper sampling patterns for measured BRDFs since no analytical expression is available directly. Although tabulation based sampling strategy provides a feasible solution to this problem, it usually requires a high memory consumption for additionally storing the importance functions. In this poster, we show that the second order spherical moment of a BRDF can be leveraged in deriving a robust sampling function for the BRDF. This sampling function has an analytical form of a GGX distribution which resembles the shape of the raw BRDF measure. Besides efficient computation and compact storage brought by the GGX distribution, another benefit is its possibility to perform sampling according to the distribution of visible normals. This can further reduce the variance especially for diffuse-like materials and improve the convergence rate of the Monte Carlo numerical integration.
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