Microstructure Variations Induced by Excess PbX2or AX Within Perovskite Thin Films

Juchen Zhang
DOI: https://doi.org/10.1039/c7cc07534k
IF: 4.9
2017-01-01
Chemical Communications
Abstract:We systematically investigated the impact of stoichiometric ratio variation between PbX2 and AX on hybrid perovskite films from the perspective of microstructure, especially on the plane stacking directions, using the two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering (GIWAXS) technique. The tuned crystal plane stacking in perovskite films can consequently enlighten further explorations about the relationship between microstructure and solar cell performance.
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