Nondestructive single‐atom‐thick crystallographic scanner via sticky‐note‐like van der Waals assembling‐disassembling
Ji‐Yun Moon,Seung‐Il Kim,Soheil Ghods,Seungil Park,Seunghan Kim,SooHyun Chang,Ho‐Chan Jang,Jun‐Hui Choi,Justin S. Kim,Sang‐Hoon Bae,Dongmok Whang,Tae‐Hoon Kim,Jae‐Hyun Lee
DOI: https://doi.org/10.1002/adma.202400091
IF: 29.4
2024-04-06
Advanced Materials
Abstract:Crystallographic characteristics, including grain boundaries (GBs) and crystallographic orientation of each grain, are crucial in defining the properties of two‐dimensional materials (2DMs). To date, local microstructure analysis of 2DMs, which requires destructive and complex processes, has been primarily used to identify unknown 2DM specimens, hindering the subsequent use of characterized samples. Here, we present a nondestructive large‐area 2D crystallographic analytical method through sticky‐note‐like van der Waals (vdW) assembling‐disassembling. By the vdW assembling of veiled polycrystalline graphene (PCG) with a single‐atom‐thick single‐crystalline graphene filter (SCG‐filter), we visualize detailed crystallographic information of each grain in PCGs through a 2D Raman signal scan, which relies on the interlayer twist angle. The scanned PCGs are seamlessly separated from the SCG‐filter using vdW disassembling, preserving their original condition. The remaining SCG‐filter then reuse for additional crystallographic scans of other PCGs. We believe our methods can pave the way for advances in the crystallographic analysis of single‐atom‐thick materials, offering huge implications for the applications of 2DMs. This article is protected by copyright. All rights reserved
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology