Abstract:Multi-instance learning is a classic algorithm within the weakly supervised learning framework. Most previous approaches to multi-instance learning have typically assumed that every bag comes with its own label. However, in real-world applications, obtaining fully-labeled bags can be a challenging and resource-intensive task, primarily due to the substantial time and labor required for labeling each instance. Fortunately, collecting bags with only positive and unlabeled instances is a more feasible option. In this paper, we aim to learn an efficient binary classifier using positive and unlabeled bags. To address the absence of negative bags, we adopt a novel strategy that combines label noise learning and multi-instance kernels. Our approach involves a comprehensive analysis of empirical risk minimization in the presence of label noise, allowing us to decompose the loss function for negative bags with false negative labels into two distinct parts. Importantly, only the second part of this loss function is affected by the presence of noisy labels. To mitigate the influence of noisy labels on the negative bags, we propose the Multi-Instance Kernel-based Centroid Estimation (MIKCE) technique. MIKCE is a versatile method that can be employed with various types of data, including linear and nonlinear cases. Additionally, we provide an upper bound on the generalization error, ensuring the convergence of the MIKCE algorithm. Finally, we conduct numerical experiments on 31 public datasets to empirically validate the effectiveness of the MIKCE approach.

Metric Learning for Multi-Instance Classification with Collapsed Bags

Multiple-Instance Learning from Pairwise Comparison Bags

Metric Learning Via Penalized Optimization.

Robust and Discriminative Distance for Multi-Instance Learning

Metric Learning-Based Multi-Instance Multi-Label Classification with Label Correlation

Image classification with multi-view multi-instance metric learning

Multi-metric learning by a pair of twin-metric learning framework

Two-Level Multi-Task Metric Learning with Application to Multi-Classification

OPM2L: an Optimal Instance Partition-Based Multi-Metric Learning Method for Heterogeneous Dataset Classification

A multi-birth metric learning framework based on binary constraints

Multi-instance Learning in the Presence of Positive and Unlabeled Bags

Learning Instance Specific Distance for Multi-Instance Classification.

Explicit Metric-Based Multiconcept Multi-Instance Learning with Triplet and Superbag

Learning a Distance Metric from Multi-Instance Multi-Label Data

Collaborative Multi-View Metric Learning For Visual Classification

Local Large-Margin Multi-Metric Learning for Face and Kinship Verification

Multiple-Instance Learning from Similar and Dissimilar Bags

Multi-Level Metric Learning Via Smoothed Wasserstein Distance

Exploiting Inconsistency Problem in Multi-label Classification Via Metric Learning

Multi-view metric learning for visual classification

Multiple Instance Learning Via Distance Metric Optimization