A Thickness Measurement System for Metal Films Based on Eddy-Current Method With Phase Detection

Wei Li,Yang Ye,Kang Zhang,Zhihua Feng
DOI: https://doi.org/10.1109/TIE.2017.2650861
IF: 7.7
2017-01-01
IEEE Transactions on Industrial Electronics
Abstract:This paper proposes a high-speed measurement system for the thickness of metal films based on the eddy-current method. Theoretical derivation shows the effects of film thickness on the impedance of the sensor coil. In a voltage division circuit, the thickness information is converted to the phase difference of two measured signals. The tangent value of the phase difference is proportional to thick...
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