A Real-Time Application-Oriented Cyber-Physical Systems for Surface Defects Detection
Xiliang Tong,Zhenyu Zhu,Dongxu Bai,Bo Tao,Juntong Yun,Xin Liu,Guojun Zhao
DOI: https://doi.org/10.1109/jsyst.2023.3293119
IF: 4.802
2023-01-01
IEEE Systems Journal
Abstract:The new generation of industrial productions is digitized, adaptable, flexible, and intelligent. Product inspection uses multisourced information and intelligent algorithm to recognize anomalies. Cyber-physical systems (CPSs) are fundamental parts of smart production and inspection. In surface inspection of industrial products, some defects, which are sensitive to the direction of light and viewer, are difficult to be recognized under fixed illumination and observation. This article presents a novel approach to solve the problem of general industrial surface inspection. The solution includes a lighting scheme, multichannel image capture, image splitting, and intelligent classification. Using a flexible and controllable hemispherical light source, we capture photometric images under illumination at specified elevations. Then, we conduct slice splitting and labeling on the images to build a dataset. Next, we build a classification network based on the ResNet backbone. To achieve better performance, we embed global squeeze and excitation module to aggregate features of multichannel images. Simultaneously add a feature pyramid network to yield feature fusion of multiscales. Comparative experiments are conducted and experimental results highlight the superiority of the proposed scheme combining multichannel photometric images and classification model. The CPSs can also be applied to other defect diagnostics’ scenarios.
computer science, information systems,telecommunications,engineering, electrical & electronic,operations research & management science