Analyzing the General Biased Data by Additive Risk Model

YanFeng Li,HuiJuan Ma,DeHui Wang,Yong Zhou
DOI: https://doi.org/10.1007/s11425-015-0383-5
2016-01-01
Science China Mathematics
Abstract:This paper proposes a unified semiparametric method for the additive risk model under general biased sampling. By using the estimating equation approach, we propose both estimators of the regression parameters and nonparametric function. An advantage is that our approach is still suitable for the lengthbiased data even without the information of the truncation variable. Meanwhile, large sample properties of the proposed estimators are established, including consistency and asymptotic normality. In addition, the finite sample behavior of the proposed methods and the analysis of three groups of real data are given.
What problem does this paper attempt to address?