The Thickness-Dependent In-Plane Uniaxial Magnetic Anisotropy in Amorphous CoFeB Films on GaAs(001) Substrates

Hongqing Tu,Biao You,Yuan Gao,Ji Wang,Xuezhong Ruan,Jun Du
DOI: https://doi.org/10.1007/s10948-016-3615-y
2016-01-01
Journal of Superconductivity and Novel Magnetism
Abstract:In-plane uniaxial magnetic anisotropy (UMA) has been studied on a series of amorphous Co 56 Fe 24 B 20 (CoFeB) films deposited on GaAs(001) substrates. With the increasing of the CoFeB thickness from 3.5 to 20.0 nm, it was found that a large uniaxial anisotropy field ( H k ) of about 270 Oe decreases monotonically to a relatively small value of about 100 Oe. The thickness dependence of H k coincides with the common interface-induced UMA model. The magnetization reversal processes of this series of CoFeB films were also investigated. The evolution of the thickness-dependent magnetization reversal mechanisms was briefly discussed in terms of the Stoner-Wohlfarth model, the pinning of domain wall model, and the modified Kondorsky model.
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