Abstract:Raman spectroscopy is a powerful technique in the characterization of carbon nanotubes (CNTs). However, this spectral method is subject to two obstacles. One is spatial resolution, namely the diffraction limits of light, and the other is its inherent small Raman cross section and weak signal. To resolve these problems, a new approach has been developed, denoted tip-enhanced Raman spectroscopy (TERS). TERS has been demonstrated to be a powerful spectroscopic and microscopic technique to characterize nanomaterial or nanostructures. Excited by a focused laser beam, an enhanced electric field is generated in the vicinity of a metallic tip because of the surface plasmon polariton (SPP) and lightening rod effect. Consequently, Raman signal from the sample area illuminated by the enhanced field nearby the tip is enhanced. At the same time, the topography is obtained in the nanometer scale. The exact corresponding relationship between the localized Raman and the topography makes the Raman identification at the nanometer scale to be feasible. In the present paper, based on an inverted microscope and a metallic AFM tip, a tip-enhanced Raman system was set up. The radius of the Au-coated metallic tip is about 30 nm. The 532 nm laser passes through a high numerical objective (NA0.95) from the bottom to illuminate the tip to excite the enhanced electric field. Corresponding with the AFM image, the tip-enhanced near-field Raman of a 100 nm diameter single-walled carbon nanotube (SWNT) bundles was obtained. The SWNTs were prepared by arc method. Furthermore, the near-field Raman of about 3 SWNTs of the bundles was received with the spatial resolution beyond the diffraction limit. Compared with the far-field Raman, the enhancement factor of the tip-enhanced Raman is more than 230. With the super-diffraction spatial resolution and the tip-enhanced Raman ability, tip-enhanced Raman spectroscopy will play an important role in the nano-material and nano-structure characterization.

Subwavelength-resolution Near-Field Raman Spectroscopy

High-resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes.

Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging

Tip-enhanced Near-Field Raman Spectroscopy with a Scanning Tunneling Microscope and Side-Illumination Optics

Application of Near-Field Raman Spectroscopy to Nano-Structure Characterization

[Development of Aperture Probe Near-Field Raman Spectroscopy and Microscopy].

A broadband and high throughput single-monochromator Raman spectrometer; application for single-wall carbon nanotubes

A Sub-Terahertz Near-Field Subwavelength Sensor Element with Micrometer Spatial Resolution Fed by A Goubau Line

Detection of Single-Walled Carbon Nanotube Bundles by Tip-Enhanced Raman Spectroscopy

Giant Raman Enhancement on Nanoporous Gold Film by Conjugating with Nanoparticles for Single-Molecule Detection

Optoplasmonic Probe to Realize Scanning Near-Field Raman Microscopy

Probing Local Optical Fields via Ultralow Frequency Raman Scattering from a Corrugated Probe

Probing Single Molecules and Single Nanoparticles by Surface-Enhanced Raman Scattering

Resonance-Amplified Terahertz Near-Field Spectroscopy of a Single Nanowire

Near-field Raman imaging using optically trapped dielectric microsphere.

Optical Origin of Subnanometer Resolution in Tip-Enhanced Raman Mapping

Single Gold-Nanoparticle-Enhanced Raman Scattering of Individual Single-Walled Carbon Nanotubes via Atomic Force Microscope Manipulation

Tip-enhanced Raman spectroscopy with silver-coated optical fiber probe in reflection mode for investigating multiwall carbon nanotubes.

Probing Electronic Transitions in Individual Carbon Nanotubes by Rayleigh Scattering.

Low-Temperature Raman Spectroscopy of Individual Single-Wall Carbon Nanotubes and Single-Layer Graphene

Probing Nano-Structures Using Rayleigh Scattering with Supercontinuum Radiation