Abstract:Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to the appearance of the defect symptom (e.g., when buggy program elements are being committed to a version control system). We refer to this type of defect localization as “Just-In-Time (JIT) Defect localization”. Although many prior studies have proposed various JIT defect identification methods to identify whether a new change is buggy, these prior methods do not locate the suspicious positions. Thus, JIT defect localization is the next step of JIT defect identification (i.e., after a buggy change is identified, suspicious source code lines are located). To address this problem, we propose a two-phase framework, i.e., JIT defect identification and JIT defect localization. Given a new change, JIT defect identification will identify it as buggy change or clean change first. If a new change is identified as buggy, JIT defect localization will rank the source code lines introduced by the new change according to their suspiciousness scores. The source code lines ranked at the top of the list are estimated as the defect location. For JIT defect identification phase, we use 14 change-level features to build a classifier by following existing approach. For JIT defect localization phase, we propose a JIT defect localization approach that leverages software naturalness with the N-gram model. To evaluate the proposed framework, we conduct an empirical study on 14 open source projects with a total of 177,250 changes. The results show that software naturalness is effective for our JIT defect localization. Our model achieves a reasonable performance, and outperforms the two baselines (i.e., random guess and a static bug finder (i.e., PMD)) by a substantial margin in terms of four ranking measures.

Regression Identification of Coincidental Correctness via Weighted Clustering

Identifying Coincidental Correctness for Fault Localization by Clustering Test Cases

A Clustering-Based Strategy to Identify Coincidental Correctness in Fault Localization.

A coincidental correctness test case identification framework with fuzzy C-means clustering

A Fault-Localization Approach Based on the Coincidental Correctness Probability

Theoretical Analysis and Empirical Study on the Impact of Coincidental Correct Test Cases in Multiple Fault Localization

A Dynamic Fault Localization Technique with Noise Reduction for Java Programs

Semantic context based coincidental correct test cases detection for fault localization

A General Noise-Reduction Framework for Fault Localization of Java Programs.

Just-In-Time Defect Identification and Localization: A Two-Phase Framework.

Using Weighted Attributes to Improve Cluster Test Selection

An Improved Regression Test Selection Technique by Clustering Execution Profiles

Theoretical Analysis on Fault Localization Formulas by Coincidental Correctness

A Comprehensive Empirical Investigation on Failure Clustering in Parallel Debugging

Defect Detection and Identification in Eddy Current Testing Using Subtractive Clustering Algorithm Combined with Rbfnn

Test Adequacy Criterion Based on Coincidental Correctness Probability

A Search Based Context-Aware Approach for Understanding and Localizing the Fault Via Weighted Call Graph

Concurrency bug localization using shared memory access pairs

A Study of Modified Testing-Based Fault Localization Method

An Innovative Method for Efficient Coverage Data Reduction in Multiple Fault Localization

An empirical study on clustering for isolating bugs in fault localization