Abstract:Fast and efficient fitting of accurate ellipses from data points has many applications in pattern recognition, machine vision, and robotics. However, the fitting accuracy may significantly degrade in the existence of outliers, such as the least-squares-based approaches. Despite robust methods attaining more accurate results than the least-squares manner under the contamination of outliers, they typically require the careful tuning of the hyper-parameters for good results. To mitigate the outlier disturbance, in this paper, we propose a conceptually simple yet quite useful preprocessing framework for high-precision ellipse fitting. Firstly, we leverage multi-scale operators to shrink the input image, by which a large number of outliers can be removed, followed by the smoothing of the sub-image to further improve the data quality. Then, we propose a key-point searching method to enhance the fitting precision via the analysis of the discrete pixel data in images. We prove that key-point-based ellipse fitting gives the upper bound of the approximation error generated by other sampled points with the same ellipse. Based on the key-point pairs inside and outside the ellipse, we further calculate their barycentric points and then perform fitting on these points to attain high-precision ellipses. We conduct extensive experiments on synthetic and real-world images to validate the proposed method and compare it with representative state-of-the-art approaches. Quantitative and qualitative results demonstrate that our method has more accurate and robust performance than competitors. Additionally, we employ the proposed method to compared approaches as a preprocessing step. Experiments demonstrate that our method is effective to significantly improve their fitting accuracy. Our source code is freely available at https://github.com/ChengQian09/MSKPF .

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