Methods of Handling the Aliasing and Tolerance Problem for a New Unified Fault Modeling Technique in Analog-Circuit Fault Diagnosis

Yuan Gao,Cheng Lin Yang,Shu Lin Tian
DOI: https://doi.org/10.4028/www.scientific.net/amr.981.11
2014-01-01
Advanced Materials Research
Abstract:Soft fault diagnosis and tolerance are two challenging problems in analog circuit fault diagnosis. This paper proposes approaches to solve these two problems. First, a complex field modeling method and its theoretical proof are presented. This fault modeling method is applicable to both hard (open or short) and soft (parametric) faults. It is also applicable to either linear or nonlinear analog circuits. Then, the parameter tolerance is taken into consideration. A frequency selection method is proposed to maximize the difference between the faults fault signature. Hence, the aliasing problem arise from tolerance can be mitigated. The effectiveness of the proposed approaches is verified by simulated results.
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