Implementation of 1.6 Tb S−1 Truly Random Number Generation Based on a Super-Luminescent Emitting Diode

Y. Liu,M-Y Zhu,B. Luo,J-W Zhang,H. Guo
DOI: https://doi.org/10.1088/1612-2011/10/4/045001
IF: 1.704
2013-01-01
Laser Physics Letters
Abstract:Using a super-luminescent emitting diode (SLED) source with a linewidth of more than 60 nm, we realize truly random number generation up to 100 Gb s(-1) by directly measuring the intensity noise, which originates from the fluctuations of spontaneous emissions. Furthermore, we propose a post-processing method in an over-sampling scheme by eliminating the correlation between adjacent samples, and achieve an ultra-high truly random number generation rate of 1.6 Tb s(-1). The randomness of the generated bit stream is verified using standard statistical test suites (Diehard and NIST-STS), and evaluated using a three-standard-deviation criterion and Shannon entropy estimation.
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