Charge State Effect on Si K X-ray Emission Induced by Iq+ions Impacting

Yu Lei,Yongtao Zhao,Rui Cheng,Xianming Zhou,Yuanbo Sun,Xing Wang,Yuyu Wang,Jieru Ren,Yongfeng Li,Yang Yu,Shidong Liu,Ge Xu
DOI: https://doi.org/10.1088/1742-6596/488/13/132038
2014-01-01
Journal of Physics Conference Series
Abstract:K X-ray emission of Si induced by Iq+ (q=20, 22, 25) ion impact has been investigated. The results show a much higher intensity of X-ray emission for I25+ ions bombardment compared to I20+ and I22+ ions. The experimental data are explained within the framework of 3dπ, δ-3dσ rotational coupling.
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