Toward 3D Mapping of Octahedral Rotations at Perovskite Thin Film Heterointerfaces Unit Cell by Unit Cell

Qian He,Ryo Ishikawa,Andrew R. Lupini,Qiao Liang,Michael D. Biegalski,Albina Borisevich

DOI: https://doi.org/10.1017/s1431927614006916

IF: 4.0991

2014-01-01

Microscopy and Microanalysis

Abstract:Oxygen octahedral rotations (OOR) in perovskites couple strongly to their electronic and magnetic properties, providing another instrument of control for creating functional materials with desired properties [1].Epitaxial thin films constitute a natural playground for manipulating OOR since the local structure and microstructure of the film can be tuned through the elastic, electrical, and chemical interactions with the substrate.It is therefore critical to characterize OOR at the heterointerface, a planar crystal defect.X-ray and neutron diffraction techniques can fully determine the octahedral rotation angles and phases, but their spatial resolution is poor [2].On the other hand, electron microscopy imaging techniques, including HRTEM [3], bright field (BF) [4] and annular bright field (ABF) [5] STEM can be used to directly visualize O columns and determine the rotation angle in each unit cell.However only one in-phase rotating axis can be studied at a time, therefore the full 3D rotation information is not available.This problem can in principle be solved via electron diffraction techniques, but they have their drawbacks: selected area electron diffraction (SAED) [6,7] is great for bulk samples but suffers from dynamic scattering and limited resolution in a thin film configuration; the recently introduced position averaged converged beam electron diffraction (PACBED) [8] requires extensive simulations, which become especially prohibitive for complex materials with several competing phenomena, since each sample parameter such as thickness, polarization, strain, and tilt, adds an extra dimension to the simulation phase space.