Crystal Growth, Structure, and Dielectric Properties of Layered Cobaltates La2−xSrxCoO4 (x = 0.4, 0.5, and 0.6) Single Crystal

S. T. Dong,N. Sun,B. B. Zhang,F. Zhang,S. H. Yao,J. Zhou,S. T. Zhang,Z. B. Gu,Y. B. Chen,Y. F. Chen
DOI: https://doi.org/10.1016/j.materresbull.2014.09.065
IF: 5.6
2015-01-01
Materials Research Bulletin
Abstract:In this work, La2-xSrxCoO4 (x = 0.4, 0.5, and 0.6) crystals with the Ruddlesden-Popper K2NiF4-type structure have been grown by the floating zone method. This compound crystallizes in the K2NiF4-type structure with space group 14/mmm. Temperature-dependent dielectric properties of the as-grown crystals were studied over a broad frequency range. The origin of the giant dielectric constant in this system is the mixed-valence structure between Co2+ and Co3+, and the dielectric constant at high frequency is related to the charge ordering structure. The dielectric relaxation shows a thermally-activated behavior. The corresponding activation energy (assigned to small polaronic hopping) can be obtained by Arrhenius fitting. (C) 2014 Elsevier Ltd. All rights reserved.
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