Using Neutral Impact Collision Ion Scattering Spectroscopy and Angular Resolved X-Ray Photoelectron Spectroscopy to Analyze Surface Structure of Surfactant Solutions

Chuangye Wang,Aiting Kan,Zhen Liu,Guodong Zhang,Xufeng Lin,Hui Fu
DOI: https://doi.org/10.1007/s00396-015-3541-8
IF: 2.4
2015-01-01
Colloid & Polymer Science
Abstract:In the present work, the surface structure of solutions of tetrabutylammonium iodide dissolved in formamide is in parallel analyzed by neutral impact collision ion scattering spectroscopy (NICISS) and angular resolved X-ray photoelectron spectroscopy (ARXPS). By NICISS, the concentration-depth profiles of the solute ions and solvent are achieved, whereas by ARXPS, those fraction-depth profiles are obtained. For the sake of convenient comparisons, the fraction-depth profiles are converted to concentration-depth profiles after the determination of the partial molar volume of the components. With those profiles, the surface structures of the solutions are mapped. The cations and anions distribute distinctly within the surface layer, indicating the complication of the surface structure of ionic surfactant solution. According to the definition of Gibbs dividing plane, the surface excesses of surfactant ions are determined. Those profiles and surface excesses obtained by two distinct methods are compared directly. The comparison shows good agreements in both items. The differences are also found during the comparison, and the causes are analyzed within the frame of the working mechanisms of those analytical techniques.
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