Performance Of Extended Wavelength Ingaas/Inasp Swir Detector

Gaoqi Cao,Tao Li,Hengjing Tang,Xiumei Shao,Xue Li,Haimei Gong
DOI: https://doi.org/10.1117/12.2069755
2014-01-01
Abstract:The single-pixel extended wavelength mesa InGaAs/InAsP SWIR detector was reported. The properties of the detector were characterized and analyzed at 160K similar to 300K. At the operating temperature of 200K, the dark current density is 1.37x10(4) nA/cm(2)(@-10mV), the cut-off wavelength is 2.43 mu m, the peak detectivity and the peak responsivity are 3.44x10(11)cmHz(1/2)W(-1) and 1.41A/W, respectively. Through analysis of the dark current source, the analysis of reverse dark current indicates that the tunneling current plays an important role at high voltage or relatively low temperature, and at near room temperature and low bias voltage, the generation-recombination current is the main current source instead of ohmic current based on thermal activation energy approximate to E-g/2 and the bias-voltage characteristic of the first order derivative of dark current, while the zero-voltage current mainly consists of the interface current and the thermal background current.
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