Dendritic Flux Avalanches and the Accompanied Thermal Strain in Type-Ii Superconducting Films: Effect of Magnetic Field Ramp Rate

Ze Jing,Huadong Yong,You-He Zhou
DOI: https://doi.org/10.1088/0953-2048/28/7/075012
2015-01-01
Abstract:Dendritic flux avalanches and the accompanying thermal stress and strain in type-II superconducting thin films under transverse magnetic fields are numerically simulated in this paper. The influence of the magnetic field ramp rate, edge defects, and the temperature of the surrounding coolant are considered. Maxwell's equations and the highly nonlinear E-J power-law characteristics of superconductors, coupled with the heat diffusion equation, are adopted to formulate these phenomena. The fast Fourier transform-based iteration scheme is used to track the evolution of the magnetic flux and the temperature in the superconducting film. The finite element method is used to analyze the thermal stress and strain induced in the superconducting film. It is found that the ramp rate has a significant effect on the flux avalanche process. The avalanches nucleate more easily for a film under a large magnetic field ramp rate than for a film under a small one. In addition, the avalanches always initiate from edge defects or areas that experience larger magnetic fields. The superconducting films experience large thermal strain induced by the large temperature gradient during the avalanche process, which may even lead to the failure of the sample.
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