A Non-Contact Graphene Surface Scattering Rate Characterization Method at Microwave Frequency by Combining Raman Spectroscopy and Coaxial Connectors Measurement

Xing-Chang Wei,Yi-Li Xu,Nan Meng,Yang Xu,Ayaz Hakro,Gao-Le Dai,Ran Hao,Er-Ping Li
DOI: https://doi.org/10.1016/j.carbon.2014.04.095
IF: 10.9
2014-01-01
Carbon
Abstract:A non-contact method is proposed to characterize graphene at microwave frequency by combining Raman spectroscopy and Amphenol Precision Connector (APC-7). The CVD-grown graphene is transferred to the ring-shape Teflon substrate and characterized by Raman spectroscopy to estimate its doping density and the related Fermi energy. The graphene is then sandwiched between two APC-7 coaxial connectors and S parameters under transverse electromagnetic (TEM) mode normal incident waves are measured to extract the surface conductivity through transmission matrix, in which the de-embedding process can be avoided. By combing the Kubo formula with our proposed circuit model, the scattering rate of graphene on Teflon substrate is obtained and analyzed.
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